Search for "frequency modulation atomic force microscopy" in Full Text gives 12 result(s) in Beilstein Journal of Nanotechnology.
Beilstein J. Nanotechnol. 2021, 12, 517–524, doi:10.3762/bjnano.12.42
Beilstein J. Nanotechnol. 2021, 12, 82–92, doi:10.3762/bjnano.12.7
Beilstein J. Nanotechnol. 2020, 11, 729–739, doi:10.3762/bjnano.11.60
Beilstein J. Nanotechnol. 2019, 10, 2084–2093, doi:10.3762/bjnano.10.203
Beilstein J. Nanotechnol. 2018, 9, 1844–1855, doi:10.3762/bjnano.9.176
Beilstein J. Nanotechnol. 2018, 9, 686–692, doi:10.3762/bjnano.9.63
Beilstein J. Nanotechnol. 2018, 9, 1–10, doi:10.3762/bjnano.9.1
Beilstein J. Nanotechnol. 2016, 7, 432–438, doi:10.3762/bjnano.7.38
Beilstein J. Nanotechnol. 2014, 5, 407–412, doi:10.3762/bjnano.5.48
Beilstein J. Nanotechnol. 2012, 3, 809–816, doi:10.3762/bjnano.3.90
Beilstein J. Nanotechnol. 2012, 3, 238–248, doi:10.3762/bjnano.3.27
Beilstein J. Nanotechnol. 2011, 2, 1–14, doi:10.3762/bjnano.2.1